Aceton, CMOS for microelectronic, J.T.Baker®
Dodavatel: Avantor
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Nebezpečí
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9015-09EA
0
CZK
9015-09
9015-10
Aceton, CMOS for microelectronic, J.T.Baker®
Acetone
Vzorec:
CH₃COCH₃ Bod varu: 56,2 °C (1013 hPa) Bod tání: –95,4 °C Hustota: 0,792 g/cm³ (20 °C) Bod vzplanutí: <–20 °C (ot. pohárek) Storage Temperature: Ambient |
MDL Number:
MFCD00008765 CAS číslo: 67-64-1 EINECS: 200-662-2 UN: 1090 ADR: 3,II REACH: 01-2119471330-49 Merck Index: 13,00067 |
Výsledky specifikačního testu
For Microelectronic Use |
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Assay ((CH₃)₂CO) (by GC, corrected for water) | ≥ 99.5 % |
Color (APHA) | ≤ 10 |
Residue after Evaporation | ≤ 5 ppm |
Titrable Acid (µeq/g) | ≤ 0.3 |
Titrable Base (µeq/g) | ≤ 0.5 |
Water (H₂O) | ≤ 0.5 % |
Solubility in H₂O | Passes Test |
Chloride (Cl) | ≤ 0.2 ppm |
Phosphate (PO₄) | ≤ 0.05 ppm |
Trace Impurities - Aluminum (Al) | ≤ 50.0 ppb |
Arsenic and Antimony (as As) | ≤ 5.0 ppb |
Trace Impurities - Barium (Ba) | ≤ 20.0 ppb |
Trace Impurities - Beryllium (Be) | ≤ 10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤ 20.0 ppb |
Trace Impurities - Boron (B) | ≤ 10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤ 10.0 ppb |
Trace Impurities - Calcium (Ca) | ≤ 25.0 ppb |
Trace Impurities - Chromium (Cr) | ≤ 10.0 ppb |
Trace Impurities - Cobalt (Co) | ≤ 10.0 ppb |
Trace Impurities - Copper (Cu) | ≤ 10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤ 10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤ 10.0 ppb |
Trace Impurities - Gold (Au) | ≤ 20 ppb |
Trace Impurities - Iron (Fe) | ≤ 20.0 ppb |
Trace Impurities - Lead (Pb) | ≤ 10.0 ppb |
Trace Impurities - Lithium (Li) | ≤ 10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤ 20 ppb |
Trace Impurities - Manganese (Mn) | ≤ 10.0 ppb |
Trace Impurities - Molybdenum (Mo) | ≤ 10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤ 10.0 ppb |
Trace Impurities - Niobium (Nb) | ≤ 50.0 ppb |
Trace Impurities - Potassium (K) | ≤ 10.0 ppb |
Trace Impurities - Silicon (Si) | ≤ 50 ppb |
Trace Impurities - Silver (Ag) | ≤ 10.0 ppb |
Trace Impurities - Sodium (Na) | ≤ 10.0 ppb |
Trace Impurities - Strontium (Sr) | ≤ 10.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤ 50.0 ppb |
Trace Impurities - Thallium (Tl) | ≤ 10.0 ppb |
Trace Impurities - Tin (Sn) | ≤ 20.0 ppb |
Trace Impurities - Titanium (Ti) | ≤ 10.0 ppb |
Trace Impurities - Vanadium (V) | ≤ 10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤ 20.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤ 10.0 ppb |
Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF or equivalent) | ≤ 150 par/ml |
Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF or equivalent) | ≤ 25 par/ml |
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